DC Arc
high
low
poor
AC Arc
Spark ICP
mid
low highest
mid
highest high
good
good best
1. Light Source 光源
类型 Eva.Temp.
Exci. Temp.
stability
Applicatio n.
Qualitative Analysis Qualitative Analysis
1. Light Source
Type Eva.Temp. Exci. Temp. stability Application.
Qualitative Analysis Qualitative Analysis Quantitative Analysis Quantitative Analysis
1. Qualitative Analysis ⑴Standard Iron Spectra Comparison ⑵Indicate Element Spectra Comparison ⑶Determination of Line Wavelength
2. Quantitative Analysis
3. Matrix Interference
3.5 Sensitivity and Detection Limit
1. Detection limit
3 D.L. Cs Rs
(3.7)
直流电 弧 交流电 弧 火花 电感耦 合等离 子体
high mid low
low mid highest
poor good good
Quantitativ e Analysis
Quantitativ e Analysis
highest
high
best
Light Source Progresses 光源发生过程
4.
ICP-AES Instrumentation System
Two-dimensional array produced by the echelle mount
Fig 3-16 Scheme of SCD Detector
3.3 Analytical Methods of AES
Chapter 3
Atomic Emission Spectroscopy
原子发射光谱
3.1. Fundamentals of AES 原子发射光谱的基本原理 3.2. Instrumentation 仪器
3.3. Analytical Methods of AES 原子发射光谱的分析方法 3.4. Control of Analytical Interferences 控制分析干扰

n
i
(3.2)
(3.3)
ni ac
b
⑵Lomakin Formula
I AC
b
(3.4)
⑶Internal Standard Methods
Ix Ax b b R Cx KC x b I s As Cs
⑷Standard Calibration Methods
(3.5)
lg R b lg C lg K
Quantitative Formula
⑴theoretical Formula of AES
I
I
ul
Aul hvul


g
Z

u
1 x E kT e ni 1 1 x
u
(3.1)
ul
A hv
ul
g
Z
ul
ul
x Eu kT e 1 1 al Interferences
1. Spectrum Interference 2. Background Interference 3. Matrix Interference
1. Spectrum Interference
2. Background Interference
2.
Spectrometer
⑴Monochromater Optical-direct Read Spectrometor
⑵Polychromater Optical-direct Read Spectrometor
3. Detector
⑴Spectrograph
⑵Photomultiplier Tube ⑶Segmented-array Charge-Coupled Detector(SCD)
3.1. Fundamentals of AES
原子发射光谱的基本原理
Atomic Emission Processes 原子 发射过程
3.2. Instrumentation 仪器
1. Light source 光源 3. Detector 检测器
2. Spectrometer 分光仪 4. Readout显示器