24~32
Ceramic Plastic
2.54 mm (100miles)
Surface Mount
SOP Small Outline Package
QFP Quad-Flat
Pack
封裝型式
Shape
Typical Features
Material Lead Pitch No of I/O
Plastic
半导体封装制程与设备材料知识简介
Prepare By：William Guo 2007 . 11 Update
半导体封装制程概述
半导体前段晶圆wafer制程 半导体后段封装测试
封装前段（B/G-MOLD）－封装后段（MARK-PLANT）－测试
封装就是將前製程加工完成後所提供晶圓中之每一顆IC晶粒獨立分離，並外 接信號線至導線架上分离而予以包覆包装测试直至IC成品。
Wafer Mount
Plasma
UV Cure (Optional)
Wire Bond
Molding
Post Mold Cure Laser mark
Laser Cut
Package Saw
Cleaner
Memory Test
Card Asy
Card Test
Packing for Outgoing
製造完成
Through Hole Mount
DIP
Dual In-line Package
封 裝 型 式 (PACKAGE)
Shape
Typical Features
Material Lead Pitch No of I/O
Ceramic Plastic
2.54 mm (100miles)
8 ~64
20~40
Surface Mount
PLCC
Plastic Leaded Chip Carrier
VSQF
Very Small Quad Flatpack
封裝型式
Shape
Typical Features
Material Lead Pitch No of I/O
Ceramic
1.27 mm (50miles) j-shape bend 4 direction
lead
18~124
Ceramic
0.5 mm
32~200
SMT (Optional)
Taping (Optional)
Die Saw
Assembly Main Process
Grinding (Optional)
Die Bond
Detaping (Optional)
Die Cure (Optional)
1.27 mm (50miles) 2 direction
lead
8 ~40
Plastic
1.0, 0.8, 0.65 mm
4 direction lead
88~200
Surface Mount
FPG
Flat Package of Glass
LCC
Leadless Chip
Carrier
封裝型式
Shape
SIP
Single In-line Package
Plastic
2.54 mm (100miles) 1 direction
lead
3~25
Through Hole Mount
ZIP
Zigzag In-line Package
S-DIP
Shrink Dual In-line
Package
封裝型式
Shape
半导体设备供应商介绍-前道部分
半导体设备供应商介绍-前道部分
常用术语介绍
1. SOP-Standard Operation Procedure 标准操作手册 2. WI – Working Instruction 作业指导书 3. PM – Preventive Maintenance 预防性维护 4. FMEA- Failure Mode Effect Analysis 失效模式影响分析 5. SPC- Statistical Process Control 统计制程控制 6. DOE- Design Of Experiment 工程试验设计 7. IQC/OQC-Incoming/Outing Quality Control 来料/出货质量检验 8. MTBA/MTBF-Mean Time between assist/Failure 平均无故障工作时间 9. CPK-品质参数 10. UPH-Units Per Hour 每小时产出 11. QC 7 Tools ( Quality Control 品管七工具 ) 12. OCAP ( Out of Control Action Plan 异常改善计划 ) 13. 8D ( 问题解决八大步骤 ) 14. ECN Engineering Change Notice ( 制程变更通知 ) 15. ISO9001， 14001 – 质量管理体系
Package
PBGA
Pin Grid Array
封裝型式
Shape
Typical Features
Material Lead Pitch No of I/O
Ceramic Plastic
2.54 mm (100miles) half-size pitch in the
width direction
Typical Features
Material Lead Pitch No of I/O
Plastic
2.54 mm (100miles) 1 direction
lead
16~24
Plastic
1.778 mm (70miles)
20 ~64
Through Hole Mount
SK-DIP
Skinny Dual In-line
Deposition (沉积)
WireBonding (焊线)
Lithography (微影)
Wafer Inspection (晶圆检查) 前段結束
Molding (塑封)
Laser mark (激光印字)
Laser Cut & package saw Testing
(切割成型)
(测试)
Package (包装)
半导体制程
IC制造开始
Wafer Cutting (晶圆切断)
Wafer Reduce (晶圆减薄)
Etching (蚀刻)
后段封装开始
Diffusion Ion
Implantation (扩散离子植入)
Grind & Dicing (晶圓研磨及切割)
Die Attach (上片)
Oxidization (氧化处理)
Typical Features
Material Lead Pitch No of I/O
1.27, 0.762 mm (50, 30miles)
Ceramic 2, 4 direction lead
20~80
Ceramic
1.27,1.016, 0.762 mm (50, 40, 30
miles)